MRB-3200DVCL
Category:
Discrete Device Test System DTS-1000 Series
Product Description
MRB-3200-DVCL Advantages:
1. Clamp ON/OFF can be set for LV voltage.
2. Shielding ground loops can be set for each terminal B-C-E.
3. Gate oscillation can be eliminated and fixed resistance can be set.
MRB-3200-DVCL+AB Advantages:
1. No need for LV DIODE-BOX (IGBT internal installation)
2. No need for AB-1000, CAB-1000, VAB-1000 self-test boxes (high-precision resistors for self-test 0.05%-0.25% are included)
I. Overview:
With the development and changes of high-power devices, in response to the demand for modular IGBT modules, JUNO has developed a special test option that can scan and test components for IGBT modules. The MRB-3200DVCL option can be connected to DTS (DTS-1000), high voltage option (DHV-1000), high current option (DHC-1000), and avalanche withstand tester (LV-1000) for combined testing. In addition, you can add a self-check function by adding options, and automatically check the equipment regularly through the program preset in the software. The advantage is to prevent equipment damage caused by human error in operation and connection errors; regularly add a self-check process to prevent equipment failure and keep abreast of the equipment's operating status.
2. Overall dimensions:
Width (W)X Height (H)X Depth (D):178mmX465mmX605mm
3. Basic specifications:
The switching mode is controlled by DTS-1000, with a maximum scan of 8 pins. The test current and voltage capabilities of each pin are as follows:
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