1、Summary
The DTS-1000 system tester can realize high-speed testing and sorting of semiconductor discrete devices by connecting with the probe station of the sorter. The testable devices of the system include transistor, field effect transistor (MOS-FET), diode, voltage regulator diode (Zener), transistor switching time (TS), capacity test (CV), thermal resistance (dVBE, dVDS), testable thyristor (SCR), voltage regulator (3 Terminal Regulator), discharge tube (TVS) and so on The system has good scalability. The voltage can be extended to 3000 volts (V) and the current can be extended to 200 amperes (A) .
2、Features
Multiple system configurations
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Miniaturized interface box
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Good scalability of the system
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Multi-functional operating software
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More efficient production capacity
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Simple maintenance
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Simple external interface
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Future scalability
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3、Brief specification
Voltage & Current Max
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999V(1.5kV) / 20.0A(30A) Upgradeable Voltage current
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Test Channel
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Two Channel
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Input Power Request
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AC 200-240V;50Hz/60Hz
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Power consumption
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250VA
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Dimension
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DTS-1000:500(W)X670(I)X250(H)mm
Head Box:65(W)X272(I)X187(H)mm
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4、Test host specifications
● Forcing
Bias Circuit
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3 Circuit(3 Digital)(D/A Converter)
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Bias Loop
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Standard
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High Voltage Generator
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1 Circuit ( ±999V(1.5kV)/50ma)Upgradeable to 1500V
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Voltage & Current Generator
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3 Circuit
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Voltage Generator
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36V/20A(30A) Upgradeable to 30A
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Current Generator
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36V/20A(30A) Upgradeable to 30A
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● Detection
Measure Circuit
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1 Circuit(4 Digital)(A/D converter)
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High Voltage Detector
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1 Circuit(0.000V~999.9V)Upgradeable to 1500V
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Low Voltage Detector
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1 Circuit(0.000V~999.9V)Upgradeable to 1500V
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Current Generator
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1 Circuit (0.000mA~20.0A) Upgradeable to 30A
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Low Current Generator
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1 Circuit (000.0PA~999.9uA)
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Measure Circuit
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Manage using item name
Maker Manage Max 500 Items
User Manage Max 500 Items
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Relay Active Time
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3ms, 5ms can be choice(Default 3ms)
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Tester File
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Measure item max limit is 200
Sort item max limit is 200
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