LV-1000 （Inductive Load Tester）

Category:

Inductive Load Avalanche Test System LV-1000

shanghai@junotester.com

Product Description

1、Summary

Semiconductor Devices Avalanche Tolerance Tester for Avalanche Tolerance Determination of MOS-FETs and Diodes Input current into the coil. That energy is applied to the equipment as avalanche energy for tolerance test. The quality determination is judged by setting the quality range of SUS voltage and SUS time The measurement results will be displayed on the pc screen or a classification signal will be given to Handler-I/F

2、Features

● One site measurement for DTS-1000 and LV-1000 (MRB-1000 or MRB-100 option required)

● Tolerance test

Broken Test 1:

Variable Stream Mode Start current stop current step (STEP) current measurement interval setting

Broken Test 2:

Coil Variable Mode (must have CB-1000 option) Setting of capacity measurement interval in start capacity stop capacity step

3、Shape and specification

Test Devices	N-FET / P-FET
Device packaging	Single / Dual
Input voltage	AC200V～240V（50Hz/60Hz））
Exterior dimensions	500(D) x 670(D) x 250(H)

Model	LV-1000
Drain Current (Id)	0.1A - 400.0A
Peak Drain Current (Idp)	0.1A - 400.0A
Drain Voltage (Vd)	10.0V - 200.0V
Gate Voltage (Vg)	1.0V - 30.0V
Reverse Gate Voltage (Vgr)	0.0V - 30.0V
Voltage Limit (V-GATE)	10.0V – 2,500V
IH Limit	0.1A - 400.0A
IL Limit	0.1A - 400.0A
Gate On Time (TG)	0.1us - 9.999ms
Post-Short Detecting Time(DT)	1us - 9.99ms
Coil	0.1mH - 99.9mH
PreCheck	5.00 - 10.0V

１ Coil:CB-1000 0.1mH STEP

２ LV-DIODE: VG and VGR have no set items

None